Olympus U-MDICT3 Cube Housing w/ Fixed Analyzer for Transmitted DIC U-TAD Electronics and semiconductor inspection —

Electronics and semiconductor inspection — surface defect detection on wafers and components using an IX series inverted microscope

essential for any imaging workflow where chromatic shift between channels would compromise data integrity

90 (with top lens) / 0

stable output intensity that does not drift or degrade over the observation session

Olympus U-MDICT3 Cube Housing w/ Fixed Analyzer for Transmitted DIC U-TAD Electronics and semiconductor inspection —Olympus U MDICT3 Cube Housing with Fixed Analyzer for Transmitted Light DIC Cube housing with integrated fixed analyzer for transmitted light differential interference contrast (DIC) microscopy on Olympus BX3 series microscopes provides a compact, integrated DIC analyzer solution. Fixed Analyzer Cube integrated analyzer in a cube housing for transmitted light DIC Compact Design self contained cube unit for easy installation in the BX3 cube turret